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Department of Materials Science and Engineering
2005 Fall Seminar Series
September 2

Joerg R. Jinschek
Institute for Critical Technology
& Applied Science (ICTAS)
Department of Materials Science & Engineering
Virginia Tech

Transition on Electron Microscopy:
Characterization Methods in the Nano-world

Abstract

Nowadays, any cutting-edge nanoscience effort includes extensive atomic-resolution electron microscopy.   Recent technological advances in the field of electron microscopy have increased the spatial resolution into the sub-Ångstrom range, the energy resolution into the sub-eV range, and the sensitivity to resolve single atoms.   The precision in determination of the atomic column positions is even in the range of pm (10-12m).   Atomic-scale analysis plays a unique role in discovering how structures function on the nanoscale.   As an example, I will present how advanced electron microscopy has been used to describe a comprehensive picture of the general light emitting mechanism of commercially available high-brightness InGaN/GaN based green light emitting diodes (LED).   For the first time the local indium stoichiometry has been linked to the local electronic structure inside the quantum well (QW) structure.   This challenge was addressed by application of high-resolution TEM (HRTEM), reconstruction of the exit wave (EWR), annular dark field (ADF) TEM, and Z-contrast imaging (HAADF-STEM) to characterize the atom distribution.   Furthermore, valence electron energy loss spectroscopy (VEELS) has determined local band gap fluctuations.   Finally, I will briefly discuss the exciting research opportunities that exist by applying experimental TEM methodologies, such as 3-D electron microscopy (electron tomography). Their application will provide critical information to help understand the nanoscale phenomena.

Biographical Information

Joerg R. Jinschek will be responsible for the new Electron Microscope Lab. at Virginia Tech, which is part of the Advanced Materials Characterization Facility of the Institute for Critical Technology and Applied Science (ICTAS). He is also a Research Assistant Professor at the Department of Materials Science and Engineering (MSE).    He received his Diploma and Ph.D. degree in physics from the Friedrich-Schiller-University Jena / Germany in 1997 and 2001, respectively.   He is recipient of the Feodor-Lynen-Fellowship of the Alexander-von-Humboldt-Foundation / Germany.   For the last 4 years he was a postdoctoral research fellow at the National Center for Electron Microscopy (NCEM) at the Lawrence Berkeley National Lab. (LBNL) and the Department of Materials Science and Engineering at University of California at Berkeley, CA.   His research focuses on the application of atomic-resolution electron microscopy on nanoscale phenomena.

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