The process of metallization is one of the most vital and lengthy processes in creating an integrated circuit. The metals laid down during this process provide the connections that circuit needs in order to work. Without metallization, the electrons would be unable to move. Metallization begins after the formation of the n channel in the wafer and does not end until the wafer is ready for a protective buffer layer coating. During the metallization process, the wafer moves to and from different areas in the manufacturing facility for processes such as photoresist application and ion implantation. This section will explain the purpose of the different metals and detail the process of applying each layer. While reviewing the process the reader may find it helpful to use the links provided to learn about the processes that occur during the metallization process.
Metallization makes use of four primary processes. These four processes involved in metallization are: Sputtering Evaporation Electro-Plating Liftoff
Sputtering, evaporation, and electro-plating are all different ways of applying the various metals while liftoff is the process of removing the excess metal. Below is informative overview of the metallization process.
The metallization process begins after the formation of n channels in the wafer. The first metal applied is the gate metal, titanium tungsten nitride (TiWN). TiWN is applied using the sputtering process to coat the entire wafer as shown below. The benefit of using TiWN is that TiWN is essentially a refractory metal (W). Because of this property it can withstand the 900oC temperatures used later in the ion-implantation anneal.

Once the TiWN is down, the wafer is ready for a layer of photoresist. The photoresist, applied by photolithography, covers all of the TiWN except for where the n-channels (the gates) are. Then, using evaporation, the wafer is coated with a thin layer of nickel (Ni).

The liftoff process then removes the nickel coating on the photoresist. This removes all of the nickel, except for that which covers the TiWN over the n-channel. The photoresist is also removed.

The TiWN then undergoes a reactive ion etch that removes all of the TiWN, except for that which is under the Ni. This results in the Ni and TiWN forming a T-shape. The purpose of this T-shape is to keep the n+ implant, generally Si+, from doping the TiWN during the ion-implantation process.

After the removal of the protective nickel barrier, the wafer undergoes a series of photolithography and ion-implantation processes. These processes place more implants into the wafer and form boundaries between the transistor and other elements of the circuit. Once these steps are completed, another photoresist is applied. This one covers the SiON layer applied during the photolithography and ion-implantation processes. This resist covers everything except for the n+ regions of the transistor. The n+ regions are where source and drain of the transistor reside.

Nickel (Ni), Germanium (Ge), and then Gold (Au) are then evaporated onto the wafer to form the ohmic metal layer. The nickel acts as an adhesion layer while the gold and germanium make up an eutectic mixture that consists of approximately 30% Ge and 70% Au. This mixture has the advantage of having a low melting point of approximately 350oC to 400oC. Without this mixture, it would take a temperature of around 600oC just to cause the gold to melt. Once the mixture melts, the Ge diffuses into the uppermost portion of the n+ layer, increasing the n+ dopant level. Because of the high level of dopants, the electrons are able to tunnel through the Schottky barrier formed by the gold over the n+ doped Ge. The quantity of electrons travelling by the tunneling process is fairly linear for I-V mixtures. This is, in fact, the nature of the ohmic contact. Normally the electrons would have to travel overtop of the barrier, which is an exponential process for I-V compounds.

The undesired metal covering the resist undergoes liftoff and a different photoresist replaces the resist used in the previous process. The next coating, applied by evaporation, is metal 1. Metal 1 consists of three metals applied in the following order: titanium (Ti), palladium (Pd), and gold (Au). Titanium provides adhesion and gold provides the conductivity. The layer of palladium, placed between the two, provides a barrier to prevent the Ti and Au from chemically interacting. If there was no barrier between the two, the two would chemically interact and the Au could possibly seep into the GaAs wafer, which would be disastrous. It is also important to note that a barrier is not needed between the Au of the ohmic metal and the Ti of metal 1 because the layers are sufficiently thin so that no chemical interaction takes place.

Metal 1 also forms some of the metal interconnects in the circuits. It is not a global metal though in that it cannot cross ohmic metals. Metal 1 also serves as the bottom plate in the capacitors and it connects the inside of the inductors to the outside circuit.
Through photolithography processes, a layer of SiN, used as the dielectric in the capacitor, is deposited onto the entire circuit. Vias are then etched through the SiN.

The next two layers of metal placed on the circuit are TiWN, deposited by sputtering, and Ti/Au, deposited by evaporation.

Next, a thick layer of photoresist, placed by photolithography, covers everything but the sources and drains of the transistors, and any connection made between them and other devices in the circuit. A layer of electro-plated gold fills these voids. This thick layer provides the majority of the wiring by connecting the source and drain of the transistors to the rest of the circuit.

Finally, the metallization process is complete and after the removal of the photoresist, the circuit is ready for a buffer layer coating.

Sputtering is a metal deposition process that involves knocking atoms off a metal target by bombarding the target with high-energy gas ions from an argon (Ar) plasma (see diagram below). A good analogy is with the game of billiards where each billiard ball represents an atom. In a game of billiards, a source (white cue ball) is hit into a target (the triangular formation of colored balls). When this happens, all the balls scatter at various angles. This is called ion bombardment.

The advantages of this method include more efficient use of source metal, more control over the chemical composition of the metal on the wafer, good step coverage, and the ability to deposit metals with very high melting points.

The sputter yield equation is used to determine number of target atoms that fall from the plasma per collision. The variables ms and mt represent source and target atoms respectively. This equation is used to show the relationship between these atoms:
Sputter deposition is the process used to implant these now free target atoms (tungsten and titanium) and nitrogen onto the surface of the GaAs substrate. This process occurs within a Perkin-Elmers programmable sputtering machine (pictured below). This machine bombards the GaAs substrate repetitively with titanium tungsten nitride (TiWN) to insure a layer or thin film is deposited onto the surface of the substrate.
After ions are dislocated from the target, they migrate down to the substrate. The vapor pressure, binding energy, and potential resting points of the substrate determine whether the TiWN ions will adhere to the surface of the substrate or bounce-off and re-evaporate (stages a and b). If several atoms stick to the surface, they will join or nucleate (stages c and d). This nucleation stage is necessary for thin film formation. After a few hundred atoms nucleate on the surface, they continue to fill in the substrate islands until they finally are able to touch each other (stages e and f). This next stage is called the agglomeration or coalescence stage (stage g). It takes several angstroms of film thickness to form this stage. Finally, all the islands combine to form a continuous thin film (stage h).

Evaporation is a physical vapor deposition (PVD) process for depositing a thin film of metal on the surface of a wafer. This process works by heating a metal in a vacuum chamber to a hot enough temperature so that the vapor pressure of the metal is significant. The wafers in the chamber are left at room temperature. Once enough of the metal has evaporated, it will begin to condense on the surface of the wafer just as steam condenses on a bathroom mirror after someone takes a hot shower. By controlling the temperature and composition of the metal being evaporated, the amount of time evaporation takes place, and the temperature of the wafer, the final amount, structure, and composition of the metal on the wafer can be controlled.
There are several different methods for heating the metal to evaporate it. For metals with a low melting point (around 1000 K), the metal is placed in a crucible and a current is sent through it. The current heats the metal, but not the crucible, so the only thing that evaporates is the metal. This will not work for metals with a high melting point, however, because higher temperatures will cause the crucible material to evaporate as well and contaminate the film on the wafer. To heat these materials an electron beam is focused on a very small area of the metal to be evaporated. The electrons heat the metal as they collide with it and melt a small portion of the metal. This way, the only material touching the melted metal is more of the same metal. The crucible never heats to the point that it contributes significantly to the vapor pressure.
Once the metal starts to evaporate, it acts as a point source of metal atoms. The atoms can be thought of to shoot straight out of the metal in all directions. The wafers are held in place on a semi-spherical surface above the metal. As the metal melts, the wafers are rotated about the metal to ensure a uniform layer of metal deposits on each wafer (see Figure 1).
Evaporation works well for many elements, but not so easily for alloys and compounds. The problem arises from the fact that different parts of the alloy or compound may have different vapor pressures for a given temperature. In a material made of two metals, the metal with the lower melting point will have a higher vapor pressure than the second metal. Therefore, more of the metal with the lower melting point will be deposited on the wafer. This can be corrected by altering the composition of the original metal to compensate, a process known as overloading. If the original metal is overloaded with the metal that has a lower vapor pressure, less of that metal evaporates, but there is more of it, so the two effects counter each other. This is only practical for metals with melting points that are close to each other and it is still difficult to control the composition of the metals on the wafer. For metals with melting points that differ significantly, other techniques, such as sputtering, must be used.
At ITT, most metal deposition is done by evaporation. Metals that are evaporated include nickel, germanium, gold, titanium, and palladium. The machines that ITT uses (pictured in Figures 2 and 3) work by accelerating electrons at the metal target. The electron source (pictured in Figure 4) works by thermionic emission, the same principle that a television uses. The element is heated by a current and emits electrons. These electrons are accelerated towards the metal target in the evaporation chamber using magnetic fields. Since they evaporate different metals at different stages in the process, the evaporation machine holds several different metals and allows the operator to select which one to use (see video below).
Another
Evaporator Used at ITT
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Electron
Source
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ITT also uses titanium-tungsten-nitride (TiWN) for gate metallization, but this compound cannot be evaporated because the melting point of tungsten is so high (see above). To learn more about how ITT deposits this compound, go to the sputtering page.
Electroplating is the deposition of a coating on an object by an electric current. It is an electrolytic process in which the electrolyte is a solution containing ions of the metal to be deposited. In an electrolytic process, ions from the anode are attracted to the cathode by applying an electric voltage between them. The anode is the metal to be deposited and the cathode is the surface to be plated. As metal ions move from the anode to the cathode, they are reduced and deposited on the surface forming a thick layer of metal. At the same time, the anode metal dissolves, providing more metal ions in the electrolyte. When a non-dissolving anode is used, metal ions are replenished by adding fresh electrolyte. Electroplating requires that plating current be conducted to all portions of the wafer to produce a uniform thickness.
Electroplating is usually the last major step in the fabrication process of a GaAs wafer and is often used to deposit metal on the backplane. It is usually saved for the last step because perfoming subsequent lithographic operations on the thick plated metal would be very difficult.
Electroplating is used when it is necessary to deposit a thick layer of gold. The plating is commonly between 4.5 to 5 microns thick. Because plating is a much more efficient process than evaporation and sputtering, it is the only economical means for depositing thick layers of gold. Evaporation and sputtering would use large amounts of gold, most of which would be deposited on places other than the wafer, and would have to be reclaimed. In addition to economical and recovery problems, such thick films would be very hard to pattern using etching or liftoff processes.
Plating on GaAs devices is almost always done in gold because of golds many
favorable properties for electronic components.
Golds Advantageous Properties
As with all metallization processes, good electrical contact and a properly cleaned surface are necessary. A common practice for good electrical contact is to form a small strip of metal near one edge of the wafer to provide an area for electrical contact that is well-defined. The surface must be free of any exposed oxide which would be very harmful. Usually oxides are not a problem because most GaAs processing methods consist of plating gold on top of sputtered or evaporated gold.
Two measures of the effectiveness of the electroplating process are cathode efficiency and throwing power. Williams defines these two terms as follows: "Throwing power is the ability of the plating bath to produce deposits of uniform thickness on cathodes having irregular surfaces. Cathode efficiency (or current efficiency) is the ratio of the weight of the metal actually being deposited to that which would be deposited if all the current has been utilized in depositing the metal. In general, a portion of plating current may be involved in electrochemical reactions other than metal deposition, such as depositing gases or reducing ionic species. The type of baths used to plate pure gold for microelectronics purposes usually have cathode efficiencies near 100% (cathode efficiencies can be much lower in other plating processes)" (311).
Many gold plating baths use a gold cyanide complex, usually buffered acidic because the gold cyanide complex remains stable in acidic solutions, down to a pH of about 3. These baths operate at nearly 100% cathode efficiency and are meant to produce pure gold (>99.99%). Platinum is used for the anode, although this is economic reason rather than a material reason. Other anodes, such as platinized titanium or carbon anodes can be used but these would be much more costly for plating the quantities and size needed (Williams, 312).
Step1 (GaAsTEK)
The surface is cleaned with plasma. It has a thin layer of TiWN sputtered onto the surface
and then Ti/Au is evaporated on top.
Step2 (GaAsTEK)
A thick photoresist is developed on top of the TiWN & Ti/AU mixture through
lithographic processes.
Step3 (GaAsTEK)
Clean surface with O2 plasma and electroplate thick layer of gold unto
openings.
Step4 (GaAsTEK)
Remove photoresist and inspect surface.