Recent Publications from our Group:

  1. Allison, H.D., N.D. Dowling and R.W. Hendricks
    Evaluation of the Role of Shot Peening and Agining Treatments on Residual Stresses and Fatigue Life of an Aluminum Alloy,
    in Proc. of MAT-TEX 93 Improvement of Materials, T. Ericcson, G. Pluvinage and L. Castex, eds., Detroit, MI, October, 1993, (Sournay sur Marne, France: IITT-International, 1993), pp. 35--40.

  2. Courtney, S.B., M.J. Tricard and R.W. Hendricks
    PC-based Management and Analysis of X-ray Scattering Residual Stress Data,
    in Adv. X-ray Analys., 36, (New York: Plenum, 1993), pp. 535--541.

  3. Ward, A., R.W. Hendricks and M. Brauss
    RS/hyper: A Hypertext-based Workstation for Reliable X-ray Residual Stress Measurements,
    in Adv. X-ray Analys., 36, (New York: Plenum, 1993), pp. 527--533.

  4. Ward, A., K.L. Venzant and R.W. Hendricks
    Residual Stress Analysis of Different Microstructures in Alumina Microelectronic Substrates,
    in Adv. X-ray Analys., 37, (New York: Plenum, 1994), pp. 291--298.

  5. Ward, A. and R.W. Hendricks
    The Phi Error Analysis: a Method to Interpret Oscillatory X-ray Stress Data,
    Proc. Fourth International Conf. on Residual Stress, M.R. James, ed., Baltimore, MD, June, 1994, (Bethel, CT: Soc. for Experim. Mech., 1994), pp. 235--244.

  6. Ward, A., H.D. Allison, B. Zimmerman, and R.W. Hendricks
    Sample Curvature Effects on d-versus sin2(psi) Plots for Residual Stress Analysis,
    Adv. X-Ray Analysis, New York: Plenum; (1997), pp. 291--296.

  7. Ward, A. and R.W. Hendricks
    Residual Stress in Si3N4-Passivated GaAs Wafers,
    Adv. X-ray Analys., 39, (New York: Plenum, 1995), pp. 289--295.

  8. Allison, H.D., and R.W. Hendricks
    Visuallization of Errors in Residual Stresses,
    Adv. X-ray Analysis, New York: Plenum; 1997: pp 305--310.

  9. Hendricks, R.W., and E.C. Pappas
    Writing and Communications Across the Curriculum in the Materials Science and Engineering Department at Virginia Tech,
    in Engineering Education for the 21st Century, Proc. Frontiers in Education 25th Annual Conference, Atlanta, Georgia, (1995).

  10. Hendricks, R.W., and E.C. Pappas
    An Integrated Writing and Communications Program for Materials Engineers,
    J. Eng. Ed., 85(4), Oct 1996, pp. 343-352.

  11. Gao, H., H. Guo, J.M. Blackburn, and R.W. Hendricks
    Determination of Residual Stress by X-Ray Diffraction in HSLA-100 Steel Weldments,
    in: Ericsson, T.; Odén, M., and Andersson, A., eds. Fifth International Conference on Residual Stresses; 1997 Jun 16-1997 Jun 18; Linköping, Sweden. Linköping, Sweden: Linkopings Universitet; (1998), pp. 320--325.

  12. Allison, H.D., and R.W. Hendricks
    Correlation of Barkhausen Noise Signal and X-ray Residual Stress Determination in Grinding-Burned 52100 Steel,
    in: Ericsson, T.; Odén, M., and Andersson, A., eds. Fifth International Conference on Residual Stresses; 1997 Jun 16-1997 Jun 18; Linköping, Sweden. Linköping, Sweden: Linkopings Universitet; (1998), pp. 640--645.

  13. Guo, H., H. Gao, R.W. Hendricks, R.K. Batra, Y. Lavin, Y. Levy, and L. Hesselink
    Visualization of Triaxial Residual Stress Tensors Near Welds in HSLA-100 Steel,
    in: Ericsson, T.; Odén, M., and Andersson, A., eds. Fifth International Conference on Residual Stresses; 1997 Jun 16-1997 Jun 18; Linköping, Sweden. Linköping, Sweden: Linkopings Universitet; (1998), pp. 810--816.

  14. Ward, A., and R.W. Hendricks
    Micron-Scale Strain Determination in III-V Semiconductor Devices by Computer Simulation and X-Ray Diffraction,
    in: Ericsson, T.; Odén, M., and Andersson, A., eds. Fifth International Conference on Residual Stresses; 1997 Jun 16-1997 Jun 18; Linköping, Sweden. Linköping, Sweden: Linkopings Universitet; (1998), pp. 1054--1059.

  15. Ward, A., and R.W. Hendricks
    Process-Induced Stress and Microcrack Nucleation in GaAs Wafers,
    J. Electronic Mat., 27(7), (1997), pp. 821-825.

  16. Ward, A., and R.W. Hendricks
    Symptoms of Stress Induced Gain Degradation in Sub-Micron Power MESFETs,
    J. Electronic Mat., 27(7), (1997), pp. 826-828.

  17. Pappas, E.C., and R.W. Hendricks
    Holistic Grading in Science and Engineering,
    J. Eng. Ed., 89(4), (2000), pp. 403 - 408.

    The Guidelines described in Appendices A - C are available as a stand-alone file.
  18. Hendricks, R.W.
    A Undergraduate Microchip Fabrication Facility,
    Proceedings ASEE 2001 Annual Meeting (to be published)

  19. Timmons, C.T., D.T. Gray, and R.W. Hendricks
    Process Development for an Undergraduate Microchip Fabrication Facility
    Proceedings ASEE 2001 Annual Meeting (to be published)

  20. Eckerman, P.D., and R.W. Hendricks
    A Laboratory Information Management System (LIMS) for an Undergraduate Microchip Fabrication Facility
    Proceedings ASEE 2001 Annual Meeting (to be published)

  21. R.W. Hendricks, L.J. Guido, R.A. Heflin, and S.C. Sarin
    An Interdisciplinary Curriculum for Microelectronics
    Proceedings ASEE 2001 Annual Meeting (to be published)

  22. E.C. Pappas and R.W. Hendricks
    An Update: The Materials Science and Engineering Advanced Engineering Communications Program at Virginia Tech
    (submitted to J. eng. Ed., 2001)

  23. E.C. Pappas, R.W. Hendricks, and J. Franks
    Satisfying the Non-technical ABET "a-k" Requirements: the Virginia Tech Materials Science and Engineering Communications Portfolio
    Proc. 2001 ASEE Southeast Section Conference

  24. C.S. French, D.P. Belman, D.E. Kardes, and R.W. Hendricks
    Determination of Junction Depths for Phosphorous Diffused in Silicon
    Proc. 14th IEEE Biennial University/Government/Industry Microelectronics (UGIM) Symposium held in Richmond, Virginia, June 17-20, 2001.

  25. D.S. Myers, J.L. Meyer, P. DePasquale, and R.W. Hendricks
    An Interactive Program for Determining Junctions Depths in Diffused Silicon Devices
    Proc. 14th IEEE Biennial University/Government/Industry Microelectronics (UGIM) Symposium held in Richmond, Virginia, June 17-20, 2001.

  26. P.D. Eckerman and R.W. Hendricks
    Wafer Traveler Design for an Undergraduate Microchip Fabrication Facility
    Proc. 14th IEEE Biennial University/Government/Industry Microelectronics (UGIM) Symposium held in Richmond, Virginia, June 17-20, 2001.

Last Revision: May 3, 2001