Journal Papers
J.R. Jinschek, R. Erni, N.F. Gardner, A.Y. Kim, C. Kisielowski, "Local indium segregation and band gap variations in high efficiency green light emitting InGaN/GaN diodes," Solid State Communications, 137 (4), 230-234, 2006.

T. Bartel, J.R. Jinschek, B. Freitag, P. Specht, C. Kisielwoski, "Quantitative Electron Microscopy of InN-GaN Alloys," Phys. Stat. Sol., (a) 200 (1), 167-175 (2006)"
http://www3.interscience.wiley.com/cgi-bin/abstract/112224030/ABSTRACT

J.R. Jinschek, C. Kisielowski, "Time, Energy, and Spatially Resolved TEM Investigations of Defects in InGaN," Physica B: Condensed Matter, accepted, 2005.

A.E. Porter, R.K. Nalla, A. Minor, J.R. Jinschek, C. Kisielowski, V. Radmilovic, J.H. Kinney, A.P. Tomsia, R.O. Ritchie, "A Transmission Electron Microscopy Study of Mineralization in Age-Induced Transparent Dentin," Biomaterials, 26, 7650-7600, 2005.

C. Kisielowski, J. Jinschek, "On the Feasibility to Investigate Point Defects by Advanced Electron Microscopy," in Physics of Microstructure Semiconductors, 4th Symposium on Non-Stoichiometric III-V Compounds, P. Specht et al., eds., 27, 137-144 (2002).

V. Lebedev. J. Pezoldt, V. Cimalla, J. Jinschek, F.M. Morales, and O. Ambacher, "Preparation of Epitaxial Templates for Molecular Beam Epitaxy of III-Nitrides on Silicon Substrates," Phys. Stat. Sol. c 0, 183-187 (2002).

V. Lebedev, J. Jinschek, J. Kräußlich, U. Kaiser, B. Schröter, W. Richter, "Hexagonal AIN Films Grown on Nominal and Off-axis Si(001) Substrates," Journal of Crystal Growth, 230 [3-4] 426-431 (2001).

J. Jinschek, U. Kaiser, W. Richter, "Different Void Shapes in Si at the SiC Thin Film/Si(111) Substrate Interface," Journal of Electron Microscopy, 50 [1] 3-8 (2001).

V. Lebedev, J. Jinschek, U. Kaiser, B. Schröter, W. Richter, J. Kräußlich, "Epitaxial relataionship in Wurtzite AIN on Si(001) Heterosystem," Applied Phys. Letter, 76, 2029-2031 (2000).

U. Kaiser, I. Khodos, J. Jinschek, W. Richter, "A TEM Stdy of Local Non-uniformities in Epitaxial 2H-AIN Films on Si(111) Substrate," Journal of Electron Microscopy, 48 [5] 545-554 (1999).

M. Adamic, G. Safran, P.B. Barna, I. Tomov, U. Kaiser, S. Laux, J. Jinschek, W. Richter, "Structure Evolution on NdF3 Optical Thin Films, Physica Status Solidi (a), 175, 637-649 (1999).

Conference Proceedings
F-R. Chen, C. Kisielowski, J.R. Jinschek, J. Plitzko, J.-J. Kai, "Chemical Composition and Thickness Retrieval in HRTEM by a Reversed Multislice Process," Microscopy and Microanalysis, 11 [Suppl. 2] 2157-2158 (2005).

F-R. Chen, C. Kisielowski , J.R. Jinschek, J. Plitzko, J.-J. Kai, "Toward Z-Contrast HRTEM by Reversed Multislice Process," Microscopy and Microanalysis, 11 [Suppl.2] 2156-2157 (2005).

K.J. Batenburg, J.R. Jinschek, C. Kisielowski, "Atomic Resolution Electron Tomography on a Discrete Grid: Atom Count Errors," Microscopy and Microanalysis, 11 [Suppl.2] 2120-2121 (2005).

J.R. Jinschek, H.A. Calderon, K.J. Batenburg, V. Radmilovic, and C. Kisielowski, "Discrete Tomography of Ga and InGa Particles from HREM Image Simulation and Exit Wave Reconstruction," Mat. Res. Soc. Symp. Proc., 839, P4.5 (1-6) (2004).

J.R. Jinschek, C. Kisielowski, D. Van Dyck, Ph. Geuens, "Measurement of the Indium Segregation in InGaN Based LEDs with Single Atom Sensitivity," Proceedings, Third International Conference on Solid State Lighting, I.T. Ferguson, N. Narendran, S.P. DenBaars, J.C. Carrano, eds., SPIE, Bellingham, Wash., Vol. 5187, 54-63, 2004.

C. Kisielowski, J.R. Jinschek, S. Bals, X. Xu, "Perspectives for Quantitative Phase Contrast Electron Microscopy at High Resolution," Proceedings, 13th European Microscopy Congress EMC 2004.

J.R. Jinschek, S. Bals, V. Gopal, X. Xu, C. Kisielowski, "Probing Local Stoichiometry in InGaN Based Quantum Wells of Solid-state LEDs, Microscopy and Microanalysis," Vol.10 (Suppl.2) 294-295 (2004).

J.R. Jinschek, V. Radmilovic, C. Kisielowski, "FIB Preparation for HRTEM: GaN Based Devices," Microscopy and Microanalysis, Vol.10 (Suppl.2), 1142-1143 (2004).

J.R. Jinschek, C. Kisielowski, "Quantitative Measurement of Indium Atom Distribution Inside InGaN QWs with Atomic Sensitivity," Microscopy and Microanalysis, Vol. 9 (Suppl. 2) 468-469 (2003).

J.R. Jinschek, Ch. Kisielowski, T. Radetic, U. Dahmen, M. Lentzen, A. Thust, K. Urban, "Quantitative HRTEM Investigation of an Obtuse Angle Dislocation Reaction in Gold with a CS Corrected Field Emission Microscope, Mat. Res. Soc. Symp. Proc. Vol. 727 , R1.3 (2002).

J.R. Jinschek, C. Kisielowski, M. Lentzen, K. Urban, "Quantification of the Resolved Phase Change in Reconstructed Electron Exit Waves of Gold [110] in Different Electron Microscopes," Microscopy and Microanalysis, Vol. 8 (Suppl. 2) 466-467 (2002).

C. Kisielowski, J. Jinschek, K. Mitsuishi, U. Dahmen, M. Lentzen, K. Urban, J. Ringnalda, T. Fliervoet, "Exit Wave Reconstruction, Cs Correction, Z-Contrast Microscopy: Comparative Strengths and Limitations, Proc., ICEM 15. Vol. 3, 165-166 (2002).

J. Jinschek, V. Lebedev, U. Kaiser, W. Richter, "Single Domain Structure of 2H-AlN Film on Si(001) Substrates," Mat. Res. Soc. Symp. Proc., Vol. 680E, E9.7 (2001).

J. Jinschek, U. Kaiser, V. Lebedev, and W. Richter, " Investigation of the Structure of 2H-AlN Films on Si(001) Substrates," Material Science Forum, 353-356, 783-786 (2001).

J. Jinschek, U. Kaiser, W. Richter, "Void Shapes in the Si(111) Substrate at the Heteroepitaxial Thin Film / Si Interface," Material Science Forum, 338-342, 521-524 (2000).

Invited Presentations/Papers
J.R. Jinschek, K.J. Batenburg, H.A. Calderon, D. Van Dyck, F-R. Chen, V. Radmilovic, C. Kisielowski, " Prospects for Bright Field and Dark Field Electron Tomography on a Discrete Grid, invited paper, Microscopy and Microanalysis Vol.10 (Suppl.3) 44-45 (2004).

F.-R. Chen, C. Kisielowski, J.R. Jinschek, J. Plitzko, J.-J. Kai, "Retrieving Potential Maps from Reversed Multislice Calculations," invited paper, Microscopy and Microanalysis Vol.10 (Suppl.3) 64-65 (2004).

J.R. Jinschek, R. Erni, C. Kisielowski, "Local Indium Segregation and Band Structure in High Efficiency Green Light Emitting InGaN/GaN Diodes," invited talk, The Third International Workshop on Nanoscale Spectroscopy and Nanotechnology NSS3, University of Maryland, College Park, Md., Dec. 2004.

J.R. Jinschek, K.J. Batenburg, H.A. Calderon, D. Van Dyck, F-R. Chen, V. Radmilovic, C. Kisielowski, "Prospects for Bright Field and Dark Field Electron Tomography on a Discrete Grid, invited talk, Focused Interest Group (FIG) meeting: Materials Research in an Aberration-free Environment, Microscopy & Microanalysis 2004, Savannah, Ga., Aug. 2004.

J.R. Jinschek, C. Kisielowski, "Application of TrueImage: Exit Wave Reconstruction @ NCEM," FEI Company (NL), TrueImage workshop, tutorial talk, Sept. 2003.

J.R. Jinschek, C. Kisielowski, "TEM Specimen Preparation @ NCEM for Exit Wave Reconstruction," FEI Company (NL), TrueImage workshop, tutorial talk, Sept. 2003.

J.R. Jinschek, C. Kisielowski, "If We Could Only See Single Atoms! - The Ongoing Revolution in Electron Microscopy," invited talk, 31st Electronic Material Symposium EMS, Santa Clara, Calif., April 2003.

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